Mettler Toledo introduces x-ray equipment for potato chips
The new tool aims to deliver enhanced contamination detection capabilities.

Equipment supplier Mettler Toledo Product Inspection Group has introduced the X56 DXD+ dual energy photon-counting x-ray inspection system with AI capabilities, expanding its X6 Series portfolio. This system will be on display at Pack Expo International in booth 2122.
Designed specifically for packaged applications, the X56 DXD+ enables manufacturers to inspect every product by delivering enhanced contamination detection capabilities, Mettler Toledo says. This makes the x-ray solution suitable for challenging applications where low-density contaminants, such as rubber and plastics, must be reliably detected. Food manufacturers benefit from protecting brand integrity and supporting premium product safety in complex formats, such as potato chips, potatoes, or pet food.
The X6 Series now offers manufacturers a full range of x-ray inspection solutions to suit different product sizes, from individual packs to large cases or multi-packs. The X56 DXD+ builds on the success of the X16 and X36.2 systems and brings dual energy photon-counting capabilities for medium to large-sized products on single lanes or smaller packages running across multiple lanes, in a 500 mm system width.
AI integration can help to improve the quality and reliability of quality inspection tasks while reducing unnecessary product rejection. This is beneficial to overcoming inspection challenges in complex scenarios like overlapping or mixed products, thereby contributing to increasing production process efficiencies. The AI integration is not limited to the X56 DXD+; it is also available on other x-ray systems within the Mettler Toledo product range.
Powered by DXD+ detector technology and Advanced Material Discrimination Pro (AMD Pro) software, the X56 DXD+ is suitable for complex applications that conventional single energy systems may struggle with, particularly when detecting low-density contaminants in packaged products with high variability in thickness, density, or overlapping textures, such as multi-packs, bags of crisps, or bulkier cartons. This level of detection sensitivity supports effective quality control, even in noisy or high-contrast products where conventional systems may fall short, the company says, which makes the X56 DXD+ a complement to the X6 Series. The X16 is positioned for inspecting single packages at high speed and the X36.2 is customizable for more advanced, high-throughput environments and is available for multi-lane inspections.
The X56 DXD+ has reportedly been designed with operational efficiency in mind. According to the company, the system combines detection performance with an intuitive interface, toolless belt removal for fast cleaning, and a hygienic design suited to high-speed, high-volume environments. With throughput rates of up to 500 products per minute, the X56 DXD+ aims to match the demands of production lines, helping manufacturers boost efficiency and combat rising operational costs through enhanced productivity and intelligent design.
Through built-in product quality tools including completeness checks, clip detection, and product trapped in seal inspection, the X56 DXD+ aims to support effective quality control by enhancing consistency and protecting brand integrity beyond contamination detection alone.
Compatible with a wide range of conveyor heights and reject options, and available in single or multi-lane configurations, the X56 DXD+ has been developed as a global solution for manufacturers needing greater flexibility and performance. Its software provides full traceability through a recorded image database, which can be accessed on-screen or integrated with Mettler Toledo ProdX data management software for centralized monitoring and compliance.
This connectivity, along with support for common network protocols, makes compliance easier by enabling real-time monitoring, secure record-keeping, and simplified audit readiness across global production environments. ProdX automates the monitoring, reporting, and collation of all inspection activities in real-time.
The securely stored data helps facilitate regulatory compliance, provides clear proof of due diligence to protect brand reputation and enables data-driven decisions that can lead to performance and productivity improvements across the line.
Chris Plant, head of market management at Mettler Toledo, says, “The launch of the X56 DXD+ expands our X6 Series, offering a comprehensive suite of inspection solutions tailored to modern food manufacturing. With its dual energy photon-counting capabilities, the X56 DXD+ delivers new levels of detection performance in complex packages across single and multi-lane formats. This advanced inspection capability will further help customers inspect every product with confidence, protect productivity, brand reputations and profits, plus comply easily with industry requirements.”
To learn how the X56 DXD+ dual energy photon-counting system can transform inspection for your production line, visit mt.com/xray-x56plus-pr.
Related: Mettler Toledo launches eGuide for food manufacturers
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